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New insights into degradation in multi-crystalline silicon PERC cells

06 Sep 2017
16:30 - 17:00

New insights into degradation in multi-crystalline silicon PERC cells

Carrier-induced degration (CID), also known as Light and elevated Temperature Induced 
Degradation (LeTID), in mc-Si PERC cells has become a major hurdle for the photovoltaic industry, due to the large relatve power loss it causes and the fact that the root cause has still not 
been identified.  This talk covers background on the topic, as well as new insights into the 
nature of the defect.  Our understanding of the defect system has led us to develop a new 
accelerated test for degradation that could occure on supposedly stable modules after years in 
the field.  We are currently working with industry partners to develop commercial tools to 
mitigate the degradation.