06 Sep 2017
16:30 - 17:00
New insights into degradation in multi-crystalline silicon PERC cells
Carrier-induced degration (CID), also known as Light and elevated Temperature Induced Degradation (LeTID), in mc-Si PERC cells has become a major hurdle for the photovoltaic industry, due to the large relatve power loss it causes and the fact that the root cause has still not been identified. This talk covers background on the topic, as well as new insights into the nature of the defect. Our understanding of the defect system has led us to develop a new accelerated test for degradation that could occure on supposedly stable modules after years in the field. We are currently working with industry partners to develop commercial tools to mitigate the degradation.